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EXCESS CAPACITANCE AND NON-IDEAL SCHOTTKY BARRIERS ON GAAS
被引:67
作者
:
VASUDEV, PK
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
VASUDEV, PK
[
1
]
MATTES, BL
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
MATTES, BL
[
1
]
PIETRAS, E
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
PIETRAS, E
[
1
]
BUBE, RH
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
BUBE, RH
[
1
]
机构
:
[1]
STANFORD UNIV, DEPT MAT SCI & ENGN, STANFORD, CA 94305 USA
来源
:
SOLID-STATE ELECTRONICS
|
1976年
/ 19卷
/ 07期
关键词
:
D O I
:
10.1016/0038-1101(76)90052-6
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:557 / 559
页数:3
相关论文
共 10 条
[1]
GALLIUM-ARSENIDE SURFACE FILM EVALUATION BY ELLIPSOMETRY AND ITS EFFECT ON SCHOTTKY BARRIERS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ADAMS, AC
PRUNIAUX, BR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PRUNIAUX, BR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(03)
: 408
-
414
[2]
COWLEY AM, 1965, THESIS STANFORD U
[3]
COWLEY AM, 1965, 04141 TECH REP
[4]
TRAPPING EFFECTS IN AU-N-TYPE GAAS SCHOTTKY BARRIER DIODES
FURUKAWA, Y
论文数:
0
引用数:
0
h-index:
0
FURUKAWA, Y
ISHIBASHI, Y
论文数:
0
引用数:
0
h-index:
0
ISHIBASHI, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1967,
6
(04)
: 503
-
+
[5]
DETERMINATION OF DEEP LEVELS IN SEMICONDUCTORS FROM C-V MEASUREMENTS
GLOVER, GH
论文数:
0
引用数:
0
h-index:
0
GLOVER, GH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(02)
: 138
-
&
[6]
METAL-SEMICONDUCTOR BARRIER HEIGHT MEASUREMENT BY DIFFERENTIAL CAPACITANCE METHOD - 1 CARRIER SYSTEM
GOODMAN, AM
论文数:
0
引用数:
0
h-index:
0
GOODMAN, AM
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(02)
: 329
-
&
[7]
GRIMMEISS HG, 1974, APR P C MET SEM CONT, P187
[8]
CAPACITANCE MEASUREMENTS ON AU-GAAS SCHOTTKY BARRIERS
SENECHAL, RR
论文数:
0
引用数:
0
h-index:
0
SENECHAL, RR
BASINSKI, J
论文数:
0
引用数:
0
h-index:
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BASINSKI, J
[J].
JOURNAL OF APPLIED PHYSICS,
1968,
39
(10)
: 4581
-
+
[9]
EFFECT OF SURFACE TREATMENT ON GALLIUM ARSENIDE SCHOTTKY BARRIER DIODES
SMITH, BL
论文数:
0
引用数:
0
h-index:
0
SMITH, BL
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(04)
: 502
-
&
[10]
SERIES RESISTANCE EFFECTS IN SEMICONDUCTOR CV PROFILING
WILEY, JD
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
WILEY, JD
MILLER, GL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
MILLER, GL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 265
-
272
←
1
→
共 10 条
[1]
GALLIUM-ARSENIDE SURFACE FILM EVALUATION BY ELLIPSOMETRY AND ITS EFFECT ON SCHOTTKY BARRIERS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ADAMS, AC
PRUNIAUX, BR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PRUNIAUX, BR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(03)
: 408
-
414
[2]
COWLEY AM, 1965, THESIS STANFORD U
[3]
COWLEY AM, 1965, 04141 TECH REP
[4]
TRAPPING EFFECTS IN AU-N-TYPE GAAS SCHOTTKY BARRIER DIODES
FURUKAWA, Y
论文数:
0
引用数:
0
h-index:
0
FURUKAWA, Y
ISHIBASHI, Y
论文数:
0
引用数:
0
h-index:
0
ISHIBASHI, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1967,
6
(04)
: 503
-
+
[5]
DETERMINATION OF DEEP LEVELS IN SEMICONDUCTORS FROM C-V MEASUREMENTS
GLOVER, GH
论文数:
0
引用数:
0
h-index:
0
GLOVER, GH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(02)
: 138
-
&
[6]
METAL-SEMICONDUCTOR BARRIER HEIGHT MEASUREMENT BY DIFFERENTIAL CAPACITANCE METHOD - 1 CARRIER SYSTEM
GOODMAN, AM
论文数:
0
引用数:
0
h-index:
0
GOODMAN, AM
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(02)
: 329
-
&
[7]
GRIMMEISS HG, 1974, APR P C MET SEM CONT, P187
[8]
CAPACITANCE MEASUREMENTS ON AU-GAAS SCHOTTKY BARRIERS
SENECHAL, RR
论文数:
0
引用数:
0
h-index:
0
SENECHAL, RR
BASINSKI, J
论文数:
0
引用数:
0
h-index:
0
BASINSKI, J
[J].
JOURNAL OF APPLIED PHYSICS,
1968,
39
(10)
: 4581
-
+
[9]
EFFECT OF SURFACE TREATMENT ON GALLIUM ARSENIDE SCHOTTKY BARRIER DIODES
SMITH, BL
论文数:
0
引用数:
0
h-index:
0
SMITH, BL
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(04)
: 502
-
&
[10]
SERIES RESISTANCE EFFECTS IN SEMICONDUCTOR CV PROFILING
WILEY, JD
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
WILEY, JD
MILLER, GL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
MILLER, GL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 265
-
272
←
1
→