A STUDY OF DISLOCATIONS IN IN-DOPED LEC GAAS CRYSTALS

被引:4
作者
NAKAJIMA, M [1 ]
FUJII, T [1 ]
ISHIDA, K [1 ]
机构
[1] OPTOELECTR JOINT RES LAB,NAKAHARA KU,KAWASAKI 211,JAPAN
关键词
D O I
10.1016/0022-0248(87)90144-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:295 / 302
页数:8
相关论文
共 20 条
[1]   ETCHING OF DISLOCATIONS ON LOW-INDEX FACES OF GAAS [J].
ABRAHAMS, MS ;
BUIOCCHI, CJ .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) :2855-&
[2]   LOW DISLOCATION, SEMI-INSULATING IN-DOPED GAAS CRYSTALS [J].
BARRETT, DL ;
MCGUIGAN, S ;
HOBGOOD, HM ;
ELDRIDGE, GW ;
THOMAS, RN .
JOURNAL OF CRYSTAL GROWTH, 1984, 70 (1-2) :179-184
[3]  
BROZEL MR, 1986, SEMIINSULATING 3 5 M, P133
[4]   IDENTIFICATION OF BURGERS VECTORS ALONG (111) IN IN-DOPED GAAS, BY X-RAY TRANSMISSION TOPOGRAPHY AND IMAGE SIMULATION [J].
BURLEDURBEC, N ;
PICHAUD, B ;
MINARI, F ;
SOYER, A ;
EPELBOIN, Y .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 :140-141
[5]   MECHANISM FOR DISLOCATION DENSITY REDUCTION IN GAAS CRYSTALS BY INDIUM ADDITION [J].
EHRENREICH, H ;
HIRTH, JP .
APPLIED PHYSICS LETTERS, 1985, 46 (07) :668-670
[6]   HELICAL DISLOCATIONS IN HIGHLY TE-DOPED GAAS CRYSTALS [J].
IIZUKA, T ;
KIKUCHI, M .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (02) :175-&
[7]   DISLOCATION-FREE GAAS AND INP CRYSTALS BY ISOELECTRONIC DOPING [J].
JACOB, G ;
DUSEAUX, M ;
FARGES, JP ;
VANDENBOOM, MMB ;
ROKSNOER, PJ .
JOURNAL OF CRYSTAL GROWTH, 1983, 61 (02) :417-424
[8]   A THERMOELASTIC ANALYSIS OF DISLOCATION GENERATION IN PULLED GAAS CRYSTALS [J].
JORDAN, AS ;
CARUSO, R ;
VONNEIDA, AR .
BELL SYSTEM TECHNICAL JOURNAL, 1980, 59 (04) :593-637
[9]   TRANSMISSION ELECTRON-MICROSCOPY STUDY OF MICRODEFECTS IN DISLOCATION-FREE GAAS AND INP CRYSTALS [J].
KAMEJIMA, T ;
MATSUI, J ;
SEKI, Y ;
WATANABE, H .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) :3312-3321
[10]   EFFECTS OF INDIUM LATTICE HARDENING UPON THE GROWTH AND STRUCTURAL-PROPERTIES OF LARGE-DIAMETER, SEMIINSULATING GAAS CRYSTALS [J].
MCGUIGAN, S ;
THOMAS, RN ;
BARRETT, DL ;
HOBGOOD, HM ;
SWANSON, BW .
APPLIED PHYSICS LETTERS, 1986, 48 (20) :1377-1379