GEOMETRICAL FACTORS OF ARGON INCORPORATION IN SIO2-FILMS DEPOSITED BY ION-BEAM SPUTTERING

被引:21
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MOTOHIRO, T
TAGA, Y
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D O I
10.1016/0040-6090(84)90245-1
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T [工业技术];
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08 ;
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页码:313 / 327
页数:15
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