SURFACE MODIFICATION OF YBA2CU3O7-DELTA THIN-FILMS USING THE SCANNING TUNNELING MICROSCOPE - 5 METHODS

被引:31
作者
THOMSON, RE
MORELAND, J
ROSHKO, A
机构
[1] Div. of Electromagn. Technol., Nat. Inst. of Stand. and Technol., Boulder, CO
关键词
D O I
10.1088/0957-4484/5/2/001
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have investigated using the scanning tunneling microscope (STM) as a tool for surface modification of YBa2Cu3O7-delta (YBCO) thin films and have identified five distinct methods whereby the STM tip can modify the superconductor surface. (i) By lowering the tunneling resistance we make the tip scratch or 'mill' the sample surface mechanically. (ii) By increasing the bias voltage above about 4 V we can modify the surface by an apparent electron beam damaging process. (iii) By increasing the bias voltage above 10 V and raising the tunneling current, we can cause a more dramatic effect which is probably due to a thermal process. (iv) By operating the STM in a damp carbon dioxide atmosphere we can cause the STM tip to etch the surface electrochemically. (v) Finally, we have some preliminary data suggesting that the high field under an extremely sharp tip displaces the oxygen atoms in the YBCO lattice. Examples of each of these techniques are shown and discussed.
引用
收藏
页码:57 / 69
页数:13
相关论文
共 27 条
[21]  
Shedd G. M., 1990, Nanotechnology, V1, P67, DOI 10.1088/0957-4484/1/1/012
[22]   SURFACE MODIFICATION OF BI-SR-CA-CU-O FILMS DEPOSITED INSITU BY RADIO-FREQUENCY PLASMA FLASH EVAPORATION WITH A SCANNING TUNNELING MICROSCOPE [J].
TERASHIMA, K ;
KONDOH, M ;
TAKAMURA, Y ;
KOMAKI, H ;
YOSHIDA, T .
APPLIED PHYSICS LETTERS, 1991, 59 (06) :644-646
[23]   INSULATING NANOPARTICLES ON YBA2CU3O7-DELTA THIN-FILMS REVEALED BY COMPARISON OF ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY [J].
THOMSON, RE ;
MORELAND, J ;
MISSERT, N ;
RUDMAN, DA ;
SANDERS, SC ;
COLE, BF .
APPLIED PHYSICS LETTERS, 1993, 63 (05) :614-616
[24]   DIFFUSION OF OXYGEN IN SUPERCONDUCTING YBA2CU3O7-DELTA OXIDE UPON ANNEALING IN HELIUM AND OXYGEN AMBIENTS [J].
TU, KN ;
PARK, SI ;
TSUEI, CC .
APPLIED PHYSICS LETTERS, 1987, 51 (25) :2158-2160
[25]   NANOMETER SCALE STRUCTURING OF SILICON BY DIRECT INDENTATION [J].
VANLOENEN, EJ ;
DIJKKAMP, D ;
HOEVEN, AJ ;
LENSSINCK, JM ;
DIELEMAN, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :574-576
[26]   FABRICATION OF NANOMETER FLAT AREAS ONTO YBA2CU3O7-X THIN-FILM SURFACES BY SCANNING TUNNELING MICROSCOPE [J].
VIRTANEN, JA ;
SUKETU, P ;
HUTH, GC ;
CHO, ZH .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (06) :3376-3378
[27]   FORCES IN ATOMIC FORCE MICROSCOPY IN AIR AND WATER [J].
WEISENHORN, AL ;
HANSMA, PK ;
ALBRECHT, TR ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1989, 54 (26) :2651-2653