PHOTOLUMINESCENCE AND EXCITATION SPECTROSCOPY IN HEAVILY DOPED N-TYPE AND P-TYPE SILICON

被引:123
作者
WAGNER, J
机构
来源
PHYSICAL REVIEW B | 1984年 / 29卷 / 04期
关键词
D O I
10.1103/PhysRevB.29.2002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2002 / 2009
页数:8
相关论文
共 22 条
[1]   HEAVILY DOPED SEMICONDUCTORS AND DEVICES [J].
ABRAM, RA ;
REES, GJ ;
WILSON, BLH .
ADVANCES IN PHYSICS, 1978, 27 (06) :799-892
[2]   INFRARED ABSORPTION IN HEAVILY DOPED N-TYPE SI [J].
BALKANSKI, M ;
AZIZA, A ;
AMZALLAG, E .
PHYSICA STATUS SOLIDI, 1969, 31 (01) :323-+
[3]   EFFECTIVE MASS AND INTRINSIC CONCENTRATION IN SILICON [J].
BARBER, HD .
SOLID-STATE ELECTRONICS, 1967, 10 (11) :1039-&
[4]   BAND-GAP NARROWING IN HEAVILY DOPED MANY-VALLEY SEMICONDUCTORS [J].
BERGGREN, KF ;
SERNELIUS, BE .
PHYSICAL REVIEW B, 1981, 24 (04) :1971-1986
[5]   CYCLOTRON RESONANCE OF ELECTRONS AND HOLES IN SILICON AND GERMANIUM CRYSTALS [J].
DRESSELHAUS, G ;
KIP, AF ;
KITTEL, C .
PHYSICAL REVIEW, 1955, 98 (02) :368-384
[6]   CYCLOTRON RESONANCE EXPERIMENTS IN UNIAXIALLY STRESSED SILICON - VALENCE BAND INVERSE MASS PARAMETERS AND DEFORMATION POTENTIALS [J].
HENSEL, JC ;
FEHER, G .
PHYSICAL REVIEW, 1963, 129 (03) :1041-&
[7]  
Keyes R. W., 1977, Comments on Solid State Physics, V7, P149
[8]  
LAGUILLAUME CBA, 1968, PHYS STAT SOL, V35, P599
[9]   FINE STRUCTURE IN THE ABSORPTION-EDGE SPECTRUM OF SI [J].
MACFARLANE, GG ;
MCLEAN, TP ;
QUARRINGTON, JE ;
ROBERTS, V .
PHYSICAL REVIEW, 1958, 111 (05) :1245-1254
[10]   ENERGY-GAP IN SI AND GE - IMPURITY DEPENDENCE [J].
MAHAN, GD .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2634-2646