THE EFFECT OF OXIDES ON PIXE MEASUREMENTS

被引：5

作者：

RICKARDS, J

机构：

[1] Univ Nacional Autonoma de Mexico,, Inst de Fisica, Mexico City, Mex, Univ Nacional Autonoma de Mexico, Inst de Fisica, Mexico City, Mex

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 12卷 / 02期

关键词：

* Work carried out with partial de Ciencia y Tecnologla grant;

D O I：

10.1016/0168-583X(85)90062-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：269 / 272

页数：4

共 12 条

[1] ENHANCEMENT IN PIXE ANALYSIS [J].

AHLBERG, MS .

NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2) :61-65

[2] UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS [J].

CAMPBELL, JL ;

COOKSON, JA ;

PAUL, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 212 (1-3) :427-439

[3] PIXE ANALYSIS OF THICK TARGETS [J].

CAMPBELL, JL ;

COOKSON, JA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :185-197

[4] UNCERTAINTIES IN THEORETICAL THICK TARGET PIXE YIELDS [J].

CLAYTON, E .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :567-572

[5] INNER-SHELL VACANCY PRODUCTION IN ION-ATOM COLLISIONS [J].

GARCIA, JD ;

FORTNER, RJ ;

KAVANAGH, TM .

REVIEWS OF MODERN PHYSICS, 1973, 45 (02) :111-177

[6] ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION [J].

JOHANSSON, SAE ;

JOHANSSON, TB .

NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :473-516

[7]

MONTENEGRO EC, 1982, PHYS LETT A, V92, P195, DOI 10.1016/0375-9601(82)90532-1

[8]

Northcliffe L. S., 1970, NUCL DATA A, V7, P233

[9] FULL-RANGE SOLUTION FOR MEASUREMENT OF THIN-FILM SURFACE DENSITIES WITH PROTON-EXCITED X-RAYS [J].

REUTER, FW ;

SMITH, HP .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4228-&

[10] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS [J].

REUTER, W ;

LURIO, A ;

CARDONE, F ;

ZIEGLER, JF .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) :3194-3202

← 1 2 →