EXTREMELY LOW SPECIFIC CONTACT RESISTIVITIES FOR P-TYPE GASB, GROWN BY MOLECULAR-BEAM EPITAXY
被引:18
作者:
TADAYON, B
论文数: 0引用数: 0
h-index: 0
机构:Naval Research Lab, Washington
TADAYON, B
KYONO, CS
论文数: 0引用数: 0
h-index: 0
机构:Naval Research Lab, Washington
KYONO, CS
FATEMI, M
论文数: 0引用数: 0
h-index: 0
机构:Naval Research Lab, Washington
FATEMI, M
TADAYON, S
论文数: 0引用数: 0
h-index: 0
机构:Naval Research Lab, Washington
TADAYON, S
MITTEREDER, JA
论文数: 0引用数: 0
h-index: 0
机构:Naval Research Lab, Washington
MITTEREDER, JA
机构:
[1] Naval Research Lab, Washington
来源:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
|
1995年
/
13卷
/
01期
关键词:
D O I:
10.1116/1.587979
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We have investigated different metal contacts (Cr/Au, Ti/Pt/Au, and Au) on p-type GaSb, grown by the molecular beam epitaxy. For Au contacts, specific contact resistivities in the range of 1.4 × 10-8 -7.8 × 10-8 Ω cm2 have been obtained. These are the lowest values ever reported for p-type GaSb. A simple procedure for surface preparation is also reported.