A SCANNING TUNNELING MICROSCOPE FOR THE INVESTIGATION OF THE GROWTH OF METAL-FILMS ON SEMICONDUCTOR SURFACES

被引：12

作者：

BERGHAUS, T

NEDDERMEYER, H

TOSCH, S

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1986年 / 30卷 / 05期

关键词：

D O I：

10.1147/rd.305.0520

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

SEMICONDUCTOR MATERIALS

引用

收藏

页码：520 / 524

页数：5

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