ANALYSIS OF THE GATE-VOLTAGE-DEPENDENT SERIES RESISTANCE OF MOSFETS

[1] Antognetti P., 1981, International Electron Devices Meeting, P574

[2] SPREADING RESISTANCE IN SUB-MICRON MOSFETS [J]. IEEE ELECTRON DEVICE LETTERS, 1983, 4 (02) : 27 - 29

[3] Beadle W. E., 1985, QUICK REFERENCE MANU, P1

[4] ELTOUKHY A, 1985, IEEE DEVICE RES C BO

[5] Gradshteyn I. S., 2014, TABLE INTEGRALS SERI

[6] JAHNKE E, 1945, TABLES FUNCTIONS

[7] CURRENT CROWDING ON METAL CONTACTS TO PLANAR DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (12) : 1022 - &

[8] THE SPREADING RESISTANCE OF MOSFETS [J]. IEEE ELECTRON DEVICE LETTERS, 1985, 6 (04) : 195 - 198

[9] Pals J.A., 1972, PHILIPS RES REPORT S, V7, P1

[10] A COMPREHENSIVE TWO-DIMENSIONAL VLSI PROCESS SIMULATION PROGRAM, BICEPS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (09) : 986 - 992

[1] Antognetti P., 1981, International Electron Devices Meeting, P574

[2] SPREADING RESISTANCE IN SUB-MICRON MOSFETS [J]. IEEE ELECTRON DEVICE LETTERS, 1983, 4 (02) : 27 - 29

[3] Beadle W. E., 1985, QUICK REFERENCE MANU, P1

[4] ELTOUKHY A, 1985, IEEE DEVICE RES C BO

[5] Gradshteyn I. S., 2014, TABLE INTEGRALS SERI

[6] JAHNKE E, 1945, TABLES FUNCTIONS

[7] CURRENT CROWDING ON METAL CONTACTS TO PLANAR DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (12) : 1022 - &

[8] THE SPREADING RESISTANCE OF MOSFETS [J]. IEEE ELECTRON DEVICE LETTERS, 1985, 6 (04) : 195 - 198

[9] Pals J.A., 1972, PHILIPS RES REPORT S, V7, P1

[10] A COMPREHENSIVE TWO-DIMENSIONAL VLSI PROCESS SIMULATION PROGRAM, BICEPS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (09) : 986 - 992