TRANSPORT-PROPERTIES OF 2-DIMENSIONAL ELECTRON-GAS IN ALGAAS/GAAS SELECTIVELY DOPED HETEROJUNCTIONS WITH EMBEDDED INAS DOTS

被引:103
作者
SAKAKI, H [1 ]
YUSA, G [1 ]
SOMEYA, T [1 ]
OHNO, Y [1 ]
NODA, T [1 ]
AKIYAMA, H [1 ]
KADOYA, Y [1 ]
NOGE, H [1 ]
机构
[1] JRDC,QUANTUM TRANSIT PROJECT,MEGURO KU,TOKYO 153,JAPAN
关键词
D O I
10.1063/1.115274
中图分类号
O59 [应用物理学];
学科分类号
摘要
Transport properties of two-dimensional electron gas (2DEG) are studied in selectively doped GaAs/n-AlGaAs heterojunctions, in which nanometer-scale InAs dots are embedded in the vicinity of the GaAs channel. When the distance W-d between the InAs dot layer and the channel is reduced from 80 to 15 nm, the mobility mu of electrons at 77 K decreases drastically from 1.1 X 10(5) to 1.1 X 10(3) cm(2)/V a, while the carrier concentration increases from 1.1 X 10(11) to 5.3 X 10(11) cm(-2). Such a reduction of mobility is found only when the average thickness of InAs layer is above the onset level (similar to 1.5 monolayer) for the dot formation. Origins of these changes in mu and N-s are discussed in connection with dot-induced modulations of the electronic potential V(r) in the channel. (C) 1995 American Institute of Physics.
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收藏
页码:3444 / 3446
页数:3
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