ERROR REDUCTIONS FOR A SERIOUS COMPENSATOR IMPERFECTION FOR NULL ELLIPSOMETRY

被引:12
作者
NEE, SMF
机构
[1] Physics Division, Research Department, U.S. Naval Weapons Center, China Lake, CA
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1991年 / 8卷 / 02期
关键词
D O I
10.1364/JOSAA.8.000314
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Error equations for angles of polarizers and analyzers are formulated for null ellipsometry with a seriously imperfect compensator. Analytic solutions of ellipsometric errors delta-psi and delta-DELTA for metallic samples show dependence on sin2(delta-tau/2)/cos delta-tau, where delta-tau is the retardation from a quarter-wave. The analytic solutions agree with results both from the direct computer simulation of null ellipsometry and from the numerical solutions for the error equations. Errors for data for a metallic sample agree with those predicted from the analytic solutions, and data after error reductions give accurate estimates for the complex refractive index and the surface roughness.
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页码:314 / 321
页数:8
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