共 10 条
- [1] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302
- [5] AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ, P186
- [6] LEONARD TA, 1984, TR84128 U DAYT RES I
- [7] NEE SMF, 1990, P SOC PHOTO-OPT INS, V1166, P242, DOI 10.1117/12.962895
- [8] ELLIPSOMETRIC ANALYSIS FOR SURFACE-ROUGHNESS AND TEXTURE [J]. APPLIED OPTICS, 1988, 27 (14): : 2819 - 2831
- [9] Serkowski K., 1962, ADV ASTRON ASTROPHYS, P289, DOI [10.1016/B978-1-4831-9919-1.50009-1, DOI 10.1016/B978-1-4831-9919-1.50009-1]
- [10] Smith D Y, 1985, HDB OPTICAL CONSTANT, P369