ION PROJECTION LITHOGRAPHY FOR VACUUM MICROELECTRONICS

被引:12
作者
LOSCHNER, H
STENGL, G
CHALUPKA, A
FEGERL, J
FISCHER, R
LAMMER, G
MALEK, L
NOWAK, R
TRAHER, C
WOLF, P
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 02期
关键词
D O I
10.1116/1.586847
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ion projection lithography has the advantage of demagnifying ion-optical mask-to-wafer pattern transfer with sub-0.1 mum resolution and large depth of focus (> 10 mum). There is the possibility of electronic alignment (''pattern lock'') of the projected ion image on-line during chip exposure with nanometer precision. Potential application areas of ion projection lithography include high volume silicon and GaAs chip fabrication and, implementing exposure field stitching and electrostatic step exposure techniques, the manufacture of flat panel devices based on vacuum microelectronics.
引用
收藏
页码:487 / 492
页数:6
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