INFLUENCE OF GAS-PHASE STOICHIOMETRY ON DEFECT MORPHOLOGY, IMPURITY DOPING, AND ELECTROLUMINESCENCE EFFICIENCY OF VAPOR-GROWN GAAS P-N-JUNCTIONS

被引:18
作者
ENSTROM, RE [1 ]
NUESE, CJ [1 ]
APPERT, JR [1 ]
GANNON, JJ [1 ]
机构
[1] RCA LABS, PRINCETON, NJ 08540 USA
关键词
D O I
10.1149/1.2401722
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1516 / 1523
页数:8
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[2]  
BELOUET C, 1972, J CRYST GROWTH, V13, P342
[3]  
BERSON BE, 1970, RCA REV, V31, P20
[4]  
BLAKESLEE AE, 1969, T METALL SOC AIME, V245, P577
[5]  
BLAKESLEE AE, 1971, 3 P INT S GALL ARS R, P283
[6]   PHOTOMETRIC FIGURES OF MERIT FOR SEMICONDUCTOR LUMINESCENT SOURCES OPERATING IN SPONTANEOUS MODE [J].
CARR, WN .
INFRARED PHYSICS, 1966, 6 (01) :1-&
[7]   VACANCY ASSOCIATION OF DEFECTS IN ANNEALED GAAS [J].
CHANG, LL ;
ESAKI, L ;
TSU, R .
APPLIED PHYSICS LETTERS, 1971, 19 (05) :143-&
[8]   SURFACE STRUCTURES AND PHOTOLUMINESCENCE OF MOLECULAR BEAM EPITAXIAL FILMS OF GAAS [J].
CHO, AY ;
HAYASHI, I .
SOLID-STATE ELECTRONICS, 1971, 14 (02) :125-&
[9]   RADIATIVE RECOMBINATION FROM GAAS DIRECTLY EXCITED BY ELECTRON BEAMS [J].
CUSANO, DA .
SOLID STATE COMMUNICATIONS, 1964, 2 (11) :353-358