VOLTAGE-DEPENDENT SCANNING TUNNELING MICROSCOPY IMAGING OF SEMICONDUCTOR SURFACES

被引：113

作者：

STROSCIO, JA ^{[1
]}

FEENSTRA, RM ^{[1
]}

NEWNS, DM ^{[1
]}

FEIN, AP ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575368

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：499 / 507

页数：9

相关论文

共 35 条

[1] REAL-SPACE OBSERVATION OF SURFACE-STATES ON SI(111)7X7 WITH THE TUNNELING MICROSCOPE
BECKER, RS
GOLOVCHENKO, JA
HAMANN, DR
SWARTZENTRUBER, BS
[J]. PHYSICAL REVIEW LETTERS, 1985, 55 (19) : 2032 - 2034
[2] BINNIG G, 1986, IBM J RES DEV, V30, P355
[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
BINNIG, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[4] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY
BINNIG, G
FUCHS, H
GERBER, C
ROHRER, H
STOLL, E
TOSATTI, E
[J]. EUROPHYSICS LETTERS, 1986, 1 (01): : 31 - 36
[5] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[6] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
[7] ELECTRONIC STATES ON THE RELAXED (110) SURFACE OF GAAS
CHELIKOWSKY, JR
COHEN, ML
[J]. SOLID STATE COMMUNICATIONS, 1979, 29 (03) : 267 - 271
[8] DIFFERENTIAL REFLECTIVITY OF SI(111)2X1 SURFACE WITH POLARIZED-LIGHT - A TEST FOR SURFACE-STRUCTURE
CHIARADIA, P
CRICENTI, A
SELCI, S
CHIAROTTI, G
[J]. PHYSICAL REVIEW LETTERS, 1984, 52 (13) : 1145 - 1147
[9] THE SURFACE GEOMETRY OF GAAS(110 - A RESPONSE
DUKE, CB
PATON, A
[J]. SURFACE SCIENCE, 1985, 164 (01) : L797 - L806
[10] SCANNING TUNNELING MICROSCOPY STUDIES OF SI(111)-2X1 SURFACES
FEENSTRA, RM
THOMPSON, WA
FEIN, AP
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1315 - 1319

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