THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY

[71] LEWIS PK, 1973, APPL PHYS LETT, V23, P260

[72] ION MICROPROBE ANALYZERS - HISTORY AND OUTLOOK [J]. ANALYTICAL CHEMISTRY, 1974, 46 (01) : A22 - A30

[73] LIEBL H, 1973, MAR PITTSB C CLEV

[74] LIEBL H, 1971, INT J MASS SPECTROM, V6, P401

[75] SPUTTERING ION SOURCE FOR SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) : 2893 - &

[76] MIYAKE H, 1972, INT C ION SURFACE IN

[77] SECONDARY ION EMISSION FOR SURFACE AND IN-DEPTH ANALYSIS OF TANTALUM THIN-FILMS [J]. ANALYTICAL CHEMISTRY, 1973, 45 (06) : 869 - 880

[78] NAKAMURA K, 1972, 6 P INT C XRAY OPT M

[79] SPUTTERING YIELDS OF ALKALI HALIDE SINGLE CRYSTALS BOMBARDED BY 2- TO 10-KEV IONS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) : 1678 - &

[80] NAVINSEK B, 1972, 6 P YUG S PHYS ION G

[71] LEWIS PK, 1973, APPL PHYS LETT, V23, P260

[72] ION MICROPROBE ANALYZERS - HISTORY AND OUTLOOK [J]. ANALYTICAL CHEMISTRY, 1974, 46 (01) : A22 - A30

[73] LIEBL H, 1973, MAR PITTSB C CLEV

[74] LIEBL H, 1971, INT J MASS SPECTROM, V6, P401

[75] SPUTTERING ION SOURCE FOR SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) : 2893 - &

[76] MIYAKE H, 1972, INT C ION SURFACE IN

[77] SECONDARY ION EMISSION FOR SURFACE AND IN-DEPTH ANALYSIS OF TANTALUM THIN-FILMS [J]. ANALYTICAL CHEMISTRY, 1973, 45 (06) : 869 - 880

[78] NAKAMURA K, 1972, 6 P INT C XRAY OPT M

[79] SPUTTERING YIELDS OF ALKALI HALIDE SINGLE CRYSTALS BOMBARDED BY 2- TO 10-KEV IONS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) : 1678 - &

[80] NAVINSEK B, 1972, 6 P YUG S PHYS ION G