共 11 条
- [1] ANDERSSON JC, 1980, PHILOS MAG B, V43, P51
- [4] COMPOSITIONAL DEPTH PROFILING BY AUGER-ELECTRON SPECTROSCOPY [J]. CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1978, 8 (01): : 53 - 67
- [5] MOCHIZUKI T, 1977, JPN J APPL PHYS S, V17, P37
- [6] MOHAMMADI F, 1981, SOLID STATE TECHNOL, V24, P65
- [7] REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04): : 775 - 792
- [8] COMPOSITION OF BINARY-ALLOYS BY SIMULTANEOUS SIMS AND AES MEASUREMENTS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 514 - 518
- [9] Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
- [10] SUBSTITUTIONAL DOPING OF AMORPHOUS SILICON [J]. SOLID STATE COMMUNICATIONS, 1975, 17 (09) : 1193 - 1196