OBSERVATION OF AN INTERFERENCE EFFECT FOR FLUORESCENT X-RAYS

被引：24

作者：

SASAKI, YC

SUZUKI, Y

TOMIOKA, Y

FUKUHARA, A

机构：

[1] Advanced Research Laboratory, Hitachi Ltd., Hatoyama

来源：

PHYSICAL REVIEW B | 1993年 / 48卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.48.7724

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A peculiar angular pattern is observed from Kalpha-fluorescent x rays emitted from a Zn monoatomic layer in a Langmuir-Blodgett film onto a Au substrate. A pattern similar to Young's fringe is monitored with a non-energy-dispersive two-dimensional detector (imaging plate), and is quantitatively measured by scanning the slit with an energy-dispersive detector (pure Ge detector). The fringes are in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.

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页码：7724 / 7726

页数：3

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