IONIZED CLUSTER BEAM TECHNIQUE

被引:32
作者
TAKAGI, T
机构
[1] Kyoto Univ, Sakyo, Jpn, Kyoto Univ, Sakyo, Jpn
关键词
DIELECTRIC MATERIALS - Thin Films - ION BEAMS - Applications - METALS AND ALLOYS - Thin Films - SEMICONDUCTING FILMS;
D O I
10.1016/0042-207X(86)90264-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ionized cluster beams (ICB) are widely used to deposit metal, semiconductor and insulating films. This paper describes the current state of this technology in both fundamental and applications areas. ICB provides tight control of the kinetic energy and ion content of the beam, which gives the technique a unique advantage compared to MBE, VPE, LPE, MOCVD, sputtering or other thin film deposition methods. The development of this technology should allow the deposition of high quality material at low temperature onto a wide variety of substrate surfaces and even permit the formation of thin film materials not previously possible.
引用
收藏
页码:27 / 31
页数:5
相关论文
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