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DEVICE DESIGN CONSIDERATIONS FOR ION-IMPLANTED N-CHANNEL MOSFETS
被引:35
作者
:
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
RIDEOUT, VL
[
1
]
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
GAENSSLEN, FH
[
1
]
LEBLANC, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
LEBLANC, A
[
1
]
机构
:
[1]
IBM CORP,THOMAS J WATSON RES CTR,SEMICOND DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
来源
:
IBM JOURNAL OF RESEARCH AND DEVELOPMENT
|
1975年
/ 19卷
/ 01期
关键词
:
D O I
:
10.1147/rd.191.0050
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:50 / 59
页数:10
相关论文
共 11 条
[1]
LOW-LEVEL CURRENTS IN INSULATED GATE FIELD-EFFECT TRANSISTORS
[J].
BARRON, MB
论文数:
0
引用数:
0
h-index:
0
BARRON, MB
.
SOLID-STATE ELECTRONICS,
1972,
15
(03)
:293
-+
[2]
N-TYPE SURFACE CONDUCTIVITY ON P-TYPE GERMANIUM
[J].
BROWN, WL
论文数:
0
引用数:
0
h-index:
0
BROWN, WL
.
PHYSICAL REVIEW,
1953,
91
(03)
:518
-527
[3]
DESIGN AND CHARACTERISTICS OF N-CHANNEL INSULATED-GATE FIELD-EFFECT TRANSISTORS
[J].
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
CRITCHLOW, DL
;
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
;
SCHUSTER, SE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
SCHUSTER, SE
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(05)
:430
-442
[4]
DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS
[J].
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
;
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
GAENSSLEN, FH
;
YU, HN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
YU, HN
;
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
RIDEOUT, VL
;
BASSOUS, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
BASSOUS, E
;
LEBLANC, AR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LEBLANC, AR
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1974,
SC 9
(05)
:256
-268
[5]
THRESHOLD VOLTAGE OF NONUNIFORMLY DOPED MOS STRUCTURES
[J].
DOUCET, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
DOUCET, G
;
VANDEWIE.F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
VANDEWIE.F
.
SOLID-STATE ELECTRONICS,
1973,
16
(03)
:417
-423
[6]
GAENSSLEN FH, 1973, SEP EUR SOL STAT DEV
[7]
THRESHOLD VOLTAGE AND GAIN TERM BETA OF ION-IMPLANTED ENHANCEMENT-MODE N-CHANNEL MOS-TRANSISTORS
[J].
KAMOSHID.M
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,KAWASAKI,JAPAN
KAMOSHID.M
.
APPLIED PHYSICS LETTERS,
1973,
22
(08)
:404
-405
[8]
STEADY-STATE MATHEMATICAL THEORY FOR INSULATED GATE FIELD-EFFECT TRANSISTOR
[J].
KENNEDY, DP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
KENNEDY, DP
;
MURLEY, PC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
MURLEY, PC
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(01)
:1
-12
[9]
ANALYSIS OF THRESHOLD VOLTAGE FOR SHORT-CHANNEL IGFETS
[J].
LEE, HS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,ESSEX JUNCTION,VT 05452
IBM CORP,SYST PROD DIV,ESSEX JUNCTION,VT 05452
LEE, HS
.
SOLID-STATE ELECTRONICS,
1973,
16
(12)
:1407
-1417
[10]
ION-IMPLANTED COMPLEMENTARY MOS-TRANSISTORS IN LOW-VOLTAGE CIRCUITS
[J].
SWANSON, RM
论文数:
0
引用数:
0
h-index:
0
SWANSON, RM
;
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
MEINDL, JD
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1972,
SC 7
(02)
:146
-+
←
1
2
→
共 11 条
[1]
LOW-LEVEL CURRENTS IN INSULATED GATE FIELD-EFFECT TRANSISTORS
[J].
BARRON, MB
论文数:
0
引用数:
0
h-index:
0
BARRON, MB
.
SOLID-STATE ELECTRONICS,
1972,
15
(03)
:293
-+
[2]
N-TYPE SURFACE CONDUCTIVITY ON P-TYPE GERMANIUM
[J].
BROWN, WL
论文数:
0
引用数:
0
h-index:
0
BROWN, WL
.
PHYSICAL REVIEW,
1953,
91
(03)
:518
-527
[3]
DESIGN AND CHARACTERISTICS OF N-CHANNEL INSULATED-GATE FIELD-EFFECT TRANSISTORS
[J].
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
CRITCHLOW, DL
;
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
;
SCHUSTER, SE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
SCHUSTER, SE
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(05)
:430
-442
[4]
DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS
[J].
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
DENNARD, RH
;
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
GAENSSLEN, FH
;
YU, HN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
YU, HN
;
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
RIDEOUT, VL
;
BASSOUS, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
BASSOUS, E
;
LEBLANC, AR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LEBLANC, AR
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1974,
SC 9
(05)
:256
-268
[5]
THRESHOLD VOLTAGE OF NONUNIFORMLY DOPED MOS STRUCTURES
[J].
DOUCET, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
DOUCET, G
;
VANDEWIE.F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
UNIV CATHOLIQUE LOUVAIN,INST ELECT,LAB PHYS & ELECTR ETAT SOLIDE,LOUVAIN 1348,BELGIUM
VANDEWIE.F
.
SOLID-STATE ELECTRONICS,
1973,
16
(03)
:417
-423
[6]
GAENSSLEN FH, 1973, SEP EUR SOL STAT DEV
[7]
THRESHOLD VOLTAGE AND GAIN TERM BETA OF ION-IMPLANTED ENHANCEMENT-MODE N-CHANNEL MOS-TRANSISTORS
[J].
KAMOSHID.M
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,KAWASAKI,JAPAN
KAMOSHID.M
.
APPLIED PHYSICS LETTERS,
1973,
22
(08)
:404
-405
[8]
STEADY-STATE MATHEMATICAL THEORY FOR INSULATED GATE FIELD-EFFECT TRANSISTOR
[J].
KENNEDY, DP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
KENNEDY, DP
;
MURLEY, PC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
IBM CORP, SYST PROD DIV LAB, E FISHKILL, NY 12533 USA
MURLEY, PC
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(01)
:1
-12
[9]
ANALYSIS OF THRESHOLD VOLTAGE FOR SHORT-CHANNEL IGFETS
[J].
LEE, HS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,ESSEX JUNCTION,VT 05452
IBM CORP,SYST PROD DIV,ESSEX JUNCTION,VT 05452
LEE, HS
.
SOLID-STATE ELECTRONICS,
1973,
16
(12)
:1407
-1417
[10]
ION-IMPLANTED COMPLEMENTARY MOS-TRANSISTORS IN LOW-VOLTAGE CIRCUITS
[J].
SWANSON, RM
论文数:
0
引用数:
0
h-index:
0
SWANSON, RM
;
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
MEINDL, JD
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1972,
SC 7
(02)
:146
-+
←
1
2
→