THERMAL-STABILITY AND RADIATION-STABILITY OF HYDROGEN-IMPLANTED SILICON STANDARDS FOR ION-BEAM ANALYSIS

被引:48
作者
WHITLOW, HJ
KEINONEN, J
HAUTALA, M
HAUTOJARVI, A
机构
关键词
D O I
10.1016/0168-583X(84)90008-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:505 / 510
页数:6
相关论文
共 40 条
  • [1] PRECISION STANDARD REFERENCE TARGETS FOR MICROANALYSIS BY NUCLEAR-REACTIONS
    AMSEL, G
    DAVIES, JA
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 177 - 182
  • [2] WEAR TRACES AND PATINATION ON DANISH FLINT ARTIFACTS
    ANDERSEN, HH
    WHITLOW, HJ
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 468 - 474
  • [3] ANDERSEN HH, 1982, PACT J EUROP STUDY G, V7, P447
  • [4] HYDROGEN RATIOS AND PROFILES IN DEPOSITED AMORPHOUS AND POLYCRYSTALLINE FILMS AND IN METALS USING NUCLEAR TECHNIQUES
    BENENSON, RE
    FELDMAN, LC
    BAGLEY, BG
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 547 - 550
  • [5] COMPARISON OF EXPERIMENTAL AND THEORETICAL RANGES OF HEAVY-IONS IN THE LOW-ENERGY REGION
    BISTER, M
    HAUTALA, M
    JANTTI, M
    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 42 (3-4): : 201 - 208
  • [6] RANGES OF 10-30-KEV DEUTERONS IMPLANTED INTO SOLIDS
    BORGESEN, P
    BOTTIGER, J
    MOLLER, W
    [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (08) : 4401 - 4405
  • [8] RANGE PROFILES OF 6-16-KEV HYDROGEN-IONS IMPLANTED IN METAL-OXIDES
    BOTTIGER, J
    LESLIE, JR
    RUD, N
    [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) : 1672 - 1675
  • [9] BRUYERE JC, 1980, J APPL PHYS, V51, P2199, DOI 10.1063/1.327895
  • [10] DEPTH PROFILING OF HYDROGEN IN THIN-FILMS WITH THE ELASTIC RECOIL DETECTION TECHNIQUE
    CHENG, HS
    ZHOU, ZY
    YANG, FC
    XU, ZW
    REN, YH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 601 - 606