APPLICATION OF TAILORED MODULATION TECHNIQUES TO DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY

被引：15

作者：

GRANT, JT

HOOKER, MP

SPRINGER, RW

HAAS, TW

机构：

[1] UNIVERSAL ENERGY SYST INC,DAYTON,OH 45432

[2] USAF,MAT LAB,WRIGHT PATTERSON AFB,OH 45433

来源：

SURFACE SCIENCE | 1976年 / 60卷 / 01期

关键词：

D O I：

10.1016/0039-6028(76)90002-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1 / 12

页数：12

共 15 条

[1] EFFECT OF MODULATION AMPLITUDE ON ELECTRON-EXCITED AUGER DATA FROM TITANIUM [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

SURFACE SCIENCE, 1974, 42 (01) :1-11

[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :227-230

[3] AUGER CURRENT MEASUREMENTS FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY OF SOLIDS [J].

GRANT, JT ;

HOOKER, MP ;

HAAS, TW .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1976, 55 (02) :370-376

[4]

GRANT JT, 1974, JPN J APPL PHYS, P811

[5] USE OF ANALOG INTEGRATION IN DYNAMIC BACKGROUND SUBTRACTION FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY - STUDY OF CO ON MO(110) [J].

GRANT, JT ;

HOOKER, MP ;

HAAS, TW .

SURFACE SCIENCE, 1974, 46 (02) :672-675

[6] CORRECTIONS OF AUGER-ELECTRON SIGNAL STRENGTHS FOR MODULATION AMPLITUDE DISTORTION IN A 4-GRID RETARDING POTENTIAL-ENERGY ANALYZER [J].

GRANT, JT ;

HAAS, TW .

SURFACE SCIENCE, 1974, 44 (02) :617-623

[7] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].

HARRIS, LA .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&

[8] AUGER-ELECTRON SPECTROSCOPY STUDIES OF CO ON NI SPECTRAL-LINE SHAPES AND QUANTITATIVE ASPECTS [J].

HOOKER, MP ;

GRANT, JT .

SURFACE SCIENCE, 1976, 55 (02) :741-746

[9]

HOOKER MP, 1976, SURFACE SCI, V58, P628

[10]

HOUSTON JE, 1974, REV SCI INSTRUM, V45, P897, DOI 10.1063/1.1686763

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