RELIABILITY OF GOLD-STABILIZED TANTALUM METALLIZATIONS FOR MICROWAVE-POWER TRANSISTORS

被引：7

作者：

CHRISTOU, A ^{[1
]}

DAY, HM ^{[1
]}

机构：

[1] USN, RES LAB, WASHINGTON, DC 20375 USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1974年 / 121卷 / 08期

关键词：

D O I：

10.1149/1.2401980

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

收藏

页码：1076 / 1081

页数：6

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