ATOM-PROBE STUDY OF AL-GA EXCHANGE-REACTION AT AL-GAAS INTERFACES

被引：25

作者：

NISHIKAWA, O

KANEDA, O

SHIBATA, M

NOMURA, E

机构：

来源：

PHYSICAL REVIEW LETTERS | 1984年 / 53卷 / 13期

关键词：

D O I：

10.1103/PhysRevLett.53.1252

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1252 / 1255

页数：4

共 14 条

[1] INITIAL GROWTH OF AL ON GAAS(001) AND ELECTRICAL CHARACTERIZATION OF THE INTERFACE
ANDERSSON, TG
SVENSSON, SP
LANDGREN, G
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 361 - 364
[2] RECONSTRUCTIONS OF GAAS AND AIAS SURFACES AS A FUNCTION OF METAL TO AS RATIO
BACHRACH, RZ
BAUER, RS
CHIARADIA, P
HANSSON, GV
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 335 - 343
[3] CHEMICALLY-INDUCED CHARGE REDISTRIBUTION AT AL-GAAS INTERFACES
BRILLSON, LJ
BACHRACH, RZ
BAUER, RS
MCMENAMIN, J
[J]. PHYSICAL REVIEW LETTERS, 1979, 42 (06) : 397 - 401
[4] ANGULAR-RESOLVED PHOTOEMISSION FROM GAAS(110) SURFACES WITH ADSORBED A1
HUIJSER, A
VANLAAR, J
VANROOY, TL
[J]. SURFACE SCIENCE, 1981, 102 (01) : 264 - 270
[5] ATOMIC GEOMETRY OF AL-GAAS INTERFACES - GAAS (110)-P(1X1)-AL(THETA), 0 LESS-THAN-OR-EQUAL TO THETA LESS-THAN-OR-EQUAL TO 8.5 MONOLAYERS
KAHN, A
CARELLI, J
KANANI, D
DUKE, CB
PATON, A
BRILLSON, L
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 331 - 334
[6] ATOMIC GEOMETRIES OF COMPOUND SEMICONDUCTOR SURFACES AND INTERFACES
KAHN, A
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 684 - 691
[7] LAIDIG WD, 1981, APPL PHYS LETT, V38, P776, DOI 10.1063/1.92159
[8] ENERGY DEFICITS IN PULSED FIELD EVAPORATION AND DEFICIT COMPENSATED ATOM-PROBE DESIGNS
MULLER, EW
KRISHNASWAMY, SV
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (09) : 1053 - 1059
[9] ATOM-PROBE STUDY OF THE EARLY STAGE OF SILICIDE FORMATION .2. NI-SI SYSTEM
NISHIKAWA, O
NOMURA, E
WADA, M
TSUNASHIMA, Y
HORIE, S
SHIBATA, M
YOSHIMURA, T
UEMORI, R
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (01): : 10 - 14
[10] PERFORMANCE OF THE NEW HIGH MASS RESOLUTION TIME OF FLIGHT ATOM PROBE
NISHIKAWA, O
KURIHARA, K
NACHI, M
KONISHI, M
WADA, M
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) : 810 - 818

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