DECONVOLUTION OF THE INFRARED-ABSORPTION PEAK OF THE VIBRATIONAL STRETCHING MODE OF SILICON DIOXIDE - EVIDENCE FOR STRUCTURAL ORDER

被引：69

作者：

BOYD, IW

机构：

来源：

APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 06期

关键词：

D O I：

10.1063/1.98408

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：418 / 420

页数：3

共 14 条

[1] STUDY OF THE STRUCTURE OF SILICA GLASS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

BANDO, Y ;

ISHIZUKA, K .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (03) :375-382

[2] LOCALIZATION OF NORMAL MODES IN VITREOUS SILICA, GERMANIA AND BERYLLIUM FLUORIDE [J].

BELL, RJ ;

DEAN, P ;

HIBBINSB.DC .

JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (10) :2111-&

[3] NEW INTERPRETATION OF STRUCTURE OF THERMALLY GROWN SILICON DIOXIDE [J].

BOYD, IW .

ELECTRONICS LETTERS, 1987, 23 (08) :411-413

[4] A STUDY OF THIN SILICON DIOXIDE FILMS USING INFRARED-ABSORPTION TECHNIQUES [J].

BOYD, IW ;

WILSON, JIB .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) :4166-4172

[5] STRUCTURE OF ULTRATHIN SILICON DIOXIDE FILMS [J].

BOYD, IW ;

WILSON, JIB .

APPLIED PHYSICS LETTERS, 1987, 50 (06) :320-322

[6] OPTICAL-CONSTANTS OF QUARTZ, VITREOUS SILICA AND NEUTRON-IRRADIATED VITREOUS SILICA(I) [J].

GASKELL, PH ;

JOHNSON, DW .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1976, 20 (02) :153-169

[7] OPTICAL-CONSTANTS OF QUARTZ, VITREOUS SILICA AND NEUTRON-IRRADIATED VITREOUS SILICA .2. ANALYSIS OF INFRARED-SPECTRUM OF VITREOUS SILICA [J].

GASKELL, PH ;

JOHNSON, DW .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1976, 20 (02) :171-191

[8]

GOODMAN C, 1986, PHYS CHEM GLASSES, V27, P29

[9] SI O COMPOUND FORMATION BY OXYGEN ION-IMPLANTATION INTO SILICON [J].

HENSEL, E ;

WOLLSCHLAGER, K ;

KREISSIG, U ;

SKORUPA, W ;

FINSTER, J ;

SCHULZE, D .

SURFACE AND INTERFACE ANALYSIS, 1985, 7 (05) :207-210

[10] INFRARED-ABSORPTION SPECTRA AND COMPOSITIONS OF EVAPORATED SILICON-OXIDES (SIOX) [J].

NAKAMURA, M ;

MOCHIZUKI, Y ;

USAMI, K ;

ITOH, Y ;

NOZAKI, T .

SOLID STATE COMMUNICATIONS, 1984, 50 (12) :1079-1081

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