共 19 条
- [1] BALK LJ, 1976, SCANNING ELECTRON MI, V1, P615
- [3] FEUERBAUM HP, 1979, SEM, V1, P285
- [6] Fujioka H., 1981, Transactions of the Institute of Electronics and Communication Engineers of Japan, Section E (English), VE64, P295
- [7] FUJIOKA H, 1983, SCANNING ELECTRON MI, V3, P1157
- [8] TECHNIQUE FOR LINEARIZATION OF VOLTAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (04): : 334 - &
- [9] HEMISPHERICAL RETARDING TYPE ENERGY ANALYZER FOR IC TESTING BY ELECTRON-BEAM [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 1030 - 1032
- [10] MENZEL E, 1979, SCANNING ELECTRON MI, V1, P297