PERFORMANCE OF AN IMAGING PLATE AS AN X-RAY AREA DETECTOR USED FOR PLANE-WAVE X-RAY-DIFFRACTION TOPOGRAPHY

We report the linearity, spatial resolution, and granularity of x-ray intensity images recorded on imaging plates (IPs). The IF-processing system, designed for use with a transmission electron microscope (TEM), was used to evaluate the influence of these characteristics on profiles of local lattice distortion in silicon obtained by plane-wave x-ray diffraction topography (PWT). The signal intensity was linear with x-ray doses over four orders of magnitude of intensity, as has also been reported in the case of TEM. The modulation transfer function and root mean square of x-ray intensity images were measured to evaluate the spatial resolution and granularity. The results indicate that profiles of lattice distortion with a period of more than 0.5 mm can be reproduced by PWT in combination with the present IP-processing system. (C) 1995 American Institute of Physics.