RADIATION EFFECTS ON THIN-OXIDE MOS CAPACITORS CAUSED BY ELECTRON-BEAM EVAPORATION OF ALUMINUM

被引：7

作者：

HAMASAKI, M

机构：

来源：

SOLID-STATE ELECTRONICS | 1983年 / 26卷 / 04期

关键词：

D O I：

10.1016/0038-1101(83)90127-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：299 / 303

页数：5

共 16 条

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