CHANGES OF STRUCTURAL, ELECTRICAL, AND OPTICAL-PROPERTIES OF MICROCRYSTALLINE SIXGE1-X FILMS BY ANNEALING

被引：2

作者：

KOHNO, K ^{[1
]}

IWAOKA, T ^{[1
]}

NAKASHITA, T ^{[1
]}

IMURA, T ^{[1
]}

OSAKA, Y ^{[1
]}

机构：

[1] HIROSHIMA UNIV,DEPT ELECT ENGN,HIROSHIMA 724,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1986年 / 25卷 / 07期

关键词：

D O I：

10.1143/JJAP.25.955

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：955 / 960

页数：6

共 25 条

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[25] THERMOELECTRIC-POWER, HALL-EFFECT AND DENSITY-OF-STATES MEASUREMENTS ON GLOW-DISCHARGE MICROCRYSTALLINE SILICON [J].

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