CHEMICAL-DEPOSITION OF SIO2 ON INP

被引:4
作者
BERTRAND, PA
FLEISCHAUER, PD
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 03期
关键词
D O I
10.1116/1.582702
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:832 / 836
页数:5
相关论文
共 15 条
[1]   FAST OPTICAL POSITION-SENSITIVE DETECTOR FOR MCPHERSON ESCA-36 [J].
BERTRAND, PA ;
KALINOWSKI, WJ ;
TRIBBLE, LE ;
TOLENTINO, LU .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (03) :387-389
[2]   XPS STUDY OF CHEMICALLY ETCHED GAAS AND INP [J].
BERTRAND, PA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (01) :28-33
[3]   X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF RADIATION-DAMAGED SI-SIO2 INTERFACES [J].
BERTRAND, PA ;
FLEISCHAUER, PD ;
SONG, Y .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) :1100-1103
[4]   CHEMICAL-DEPOSITION OF TIO2 LAYERS ON GAAS [J].
BERTRAND, PA ;
FLEISCHAUER, PD .
THIN SOLID FILMS, 1983, 103 (1-2) :167-175
[5]   REMOTE INDUCTIVE EFFECTS EVALUATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA) [J].
CARVER, JC ;
GRAY, RC ;
HERCULES, DM .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1974, 96 (22) :6851-6856
[6]   AN INVESTIGATION BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS OF CHEMICAL TREATMENTS OF THE (100) SURFACE OF N-TYPE INP EPITAXIAL LAYERS FOR LANGMUIR FILM DEPOSITION [J].
CLARK, DT ;
FOK, T ;
ROBERTS, GG ;
SYKES, RW .
THIN SOLID FILMS, 1980, 70 (02) :261-283
[7]  
CULINANE NM, 1951, J APPL CHEM, V1, P400
[8]   THE INFLUENCE OF ADLAYERS ON SCHOTTKY-BARRIER FORMATION - THE ADSORPTION OF H2S AND H2O ON INDIUM-PHOSPHIDE [J].
HUGHES, GJ ;
HUMPHREYS, TP ;
MONTGOMERY, V ;
WILLIAMS, RH .
VACUUM, 1981, 31 (10-1) :539-541
[9]   A CHEMICAL BONDING MODEL FOR THE NATIVE OXIDES OF THE III-V COMPOUND SEMICONDUCTORS [J].
LUCOVSKY, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :456-462
[10]   ASSOCIATION OF N-TETRA-ALKOXY- AND N-ALKOXY-CHLORO-DERIVATIVES OF TITANIUM [J].
MARTIN, RL ;
WINTER, G .
JOURNAL OF THE CHEMICAL SOCIETY, 1961, (JUL) :2947-&