ELECTRON-ENERGY DISTRIBUTIONS IN ELECTRON-CYCLOTRON RESONANCE DISCHARGES FOR MATERIALS PROCESSING

被引:49
作者
WENG, YL [1 ]
KUSHNER, MJ [1 ]
机构
[1] UNIV ILLINOIS, DEPT ELECT & COMP ENGN, 1406 W GREEN ST, URBANA, IL 61801 USA
关键词
D O I
10.1063/1.352144
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron cyclotron resonance (ECR) reactors are now being investigated for use in the plasma processing of semiconductors. The attractive feature of ECR excitation is that high plasma densities (10(10)-10(12) cm-3) Can be obtained at low pressures (0.1-a few mTorr). In this paper, we present results from a computer simulation of the electron kinetics in ECR reactors. The model is a multidimensional Monte Carlo simulation coupled with a fluid simulation with which the electron energy distribution (EED) may be calculated. We find that the electron temperature(T(e) = 2/3[epsilon])in Ar plasmas(0.1-10 mTorr, 100s W) is 10-20 eV in the ECR zone, falling to a few to 5 eV downstream of the ECR zone, in general agreement with experiments. The EED can be described as being multitemperature with a low energy component (5-10 eV) and a high energy tail extending to many 10s to 100s eV. Predicted ambipolar potentials are 10-30 V, increasing with decreasing pressure and increasing power deposition.
引用
收藏
页码:33 / 42
页数:10
相关论文
共 24 条
[11]   ION ENERGETICS IN ELECTRON-CYCLOTRON RESONANCE DISCHARGES [J].
HOLBER, WM ;
FORSTER, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (05) :3720-3725
[12]   CHARGED-PARTICLE DENSITIES AND ENERGY-DISTRIBUTIONS IN A MULTIPOLAR ELECTRON-CYCLOTRON RESONANT PLASMA-ETCHING SOURCE [J].
HOPWOOD, J ;
REINHARD, DK ;
ASMUSSEN, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3103-3112
[13]   MODELING OF PLASMA-FLOW DOWNSTREAM OF AN ELECTRON-CYCLOTRON RESONANCE PLASMA SOURCE [J].
HUSSEIN, MA ;
EMMERT, GA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :2913-2918
[14]   PLASMA CHARACTERIZATION OF AN ELECTRON-CYCLOTRON RESONANCE-RADIO-FREQUENCY HYBRID PLASMA REACTOR [J].
LEE, YH ;
HEIDENREICH, JE ;
FORTUNO, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :903-907
[15]   CHARACTERIZATION OF A PERMANENT-MAGNET ELECTRON-CYCLOTRON RESONANCE PLASMA SOURCE [J].
MANTEI, TD ;
DHOLE, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (01) :26-28
[16]  
NAKANO T, 1991, APPL PHYS LETT, V58, P459
[17]   MEASUREMENT OF ELECTRON-DENSITIES IN ELECTRON-CYCLOTRON RESONANCE PLASMAS FOR ETCHING OF III-V SEMICONDUCTORS [J].
PEARTON, SJ ;
NAKANO, T ;
GOTTSCHO, RA .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (08) :4206-4210
[18]   CHARACTERISTICS OF ELECTRON-CYCLOTRON RESONANCE PLASMA SOURCES [J].
POPOV, OA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :894-898
[19]   MODELING AND SIMULATION OF MAGNETICALLY CONFINED LOW-PRESSURE PLASMAS IN 2 DIMENSIONS [J].
PORTEOUS, RK ;
GRAVES, DB .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1991, 19 (02) :204-213
[20]   ION CURRENT-DENSITY AND ITS UNIFORMITY AT THE ELECTRON-CYCLOTRON RESONANCE POSITION IN ELECTRON-CYCLOTRON RESONANCE PLASMA [J].
SAMUKAWA, S ;
MORI, S ;
SASAKI, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (01) :85-90