CURRENT CROWDING EFFECTS AND DETERMINATION OF SPECIFIC CONTACT RESISTIVITY FROM CONTACT END RESISTANCE (CER) MEASUREMENTS

被引：10

作者：

SWIRHUN, SE

LOH, WM

SWANSON, RM

SARASWAT, KC

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 12期

关键词：

D O I：

10.1109/EDL.1985.26259

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：639 / 641

页数：3

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