EFFECT OF LINEAR EMITTER RECOMBINATION ON OCVD DETERMINATION OF LIFETIME IN P-I-N-DIODES

被引：5

作者：

BERZ, F

SLATTER, JAG

机构：

来源：

SOLID-STATE ELECTRONICS | 1982年 / 25卷 / 08期

关键词：

D O I：

10.1016/0038-1101(82)90196-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：693 / 697

页数：5

共 10 条

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[9] SPATIAL COMPOSITION AND INJECTION DEPENDENCE OF RECOMBINATION IN SILICON POWER DEVICE STRUCTURES [J].

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[10]

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