共 17 条
- [11] SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (06): : 1055 - +
- [12] MICROSCOPIC PROPERTIES AND BEHAVIOR OF SILICIDE INTERFACES [J]. SURFACE SCIENCE, 1983, 132 (1-3) : 268 - 314
- [14] ELECTRONIC STATES AND ATOMIC-STRUCTURE AT THE PD2SI-SI INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 937 - 943
- [17] SURFACE DEFECT EFFECTS ON SCHOTTKY BARRIERS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 929 - 936