ION YIELDS OF IMPURITIES IN GALLIUM-ARSENIDE FOR SECONDARY ION MASS-SPECTROMETRY

被引：10

作者：

HOMMA, Y

TANAKA, T

机构：

来源：

ANALYTICAL CHEMISTRY | 1986年 / 58卷 / 06期

关键词：

D O I：

10.1021/ac00297a028

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1108 / 1112

页数：5

共 19 条

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