FAILURE PHYSICS OF INTEGRATED-CIRCUITS - A REVIEW

被引：28

作者：

STOJADINOVIC, ND

机构：

来源：

MICROELECTRONICS RELIABILITY | 1983年 / 23卷 / 04期

关键词：

D O I：

10.1016/0026-2714(83)91158-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：609 / 707

页数：99

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