OXIDATION OF HYDROGEN DOPED TANTALUM FILMS ON SILICON

被引:5
作者
OHFUJI, S
HASHIMOTO, C
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1986年 / 4卷 / 03期
关键词
D O I
10.1116/1.583602
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:714 / 719
页数:6
相关论文
共 22 条
[1]  
ALEFELD G, 1978, HYDROGEN METALS, V2, pCH2
[2]  
HASHIMOTO C, 1985, 17TH C SOL STAT DEV, P275
[3]   RUTHERFORD BACKSCATTERING INVESTIGATION OF THERMALLY OXIDIZED TANTALUM ON SILICON [J].
HIRVONEN, J ;
REVESZ, AG ;
KIRKENDALL, TD .
THIN SOLID FILMS, 1976, 33 (03) :315-322
[4]   CHEMICAL VAPOR-DEPOSITION OF TANTALUM PENTOXIDE FILMS FOR METAL-INSULATOR-SEMICONDUCTOR DEVICES [J].
KAPLAN, E ;
BALOG, M ;
FROHMANBENTCHKOWSKY, D .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (10) :1570-1573
[5]   LEAKAGE-CURRENT INCREASE IN AMORPHOUS TA2O5 FILMS DUE TO PINHOLE GROWTH DURING ANNEALING BELOW 600-DEGREES-C [J].
KIMURA, S ;
NISHIOKA, Y ;
SHINTANI, A ;
MUKAI, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) :2414-2418
[6]  
MAISSEL LI, 1970, HDB THIN FILM TECHNO, pCH16
[7]   EFFECT OF HEAT-TREATMENT ON THE COEFFICIENT BETA-PF FOR THE POOLE-FRENKEL EFFECT AND THE CONDUCTIVITY IN TA2O5 FILMS [J].
MATSUMOTO, H ;
SUZUKI, A ;
YABUMOTO, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (01) :71-77
[8]  
MOTT NF, 1979, ELECTRONIC PROCESSES, pCH7
[9]   REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS [J].
MURARKA, SP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04) :775-792
[10]   ELECTRICAL-PROPERTIES OF AMORPHOUS TANTALUM PENTOXIDE THIN-FILMS ON SILICON [J].
OEHRLEIN, GS ;
REISMAN, A .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6502-6508