共 23 条
[1]
RAMAN-SPECTROSCOPY - VERSATILE TOOL FOR CHARACTERIZATION OF THIN-FILMS AND HETEROSTRUCTURES OF GAAS AND ALXGA1-XAS
[J].
APPLIED PHYSICS,
1978, 16 (04)
:345-352
[10]
SILICON DIFFUSION AT POLYCRYSTALLINE-SI/GAAS INTERFACES
[J].
APPLIED PHYSICS LETTERS,
1985, 47 (11)
:1208-1210