THE APPLICATION OF DEEP LEVEL TRANSIENT SPECTROSCOPY TO THE MEASUREMENT OF RADIATION-INDUCED INTERFACE STATE SPECTRA

被引：16

作者：

BARNES, C

ZIETLOW, T

NAKAMURA, K

机构：

[1] Aerosp Corp, Los Angeles, CA, USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

This work was supported under contract FO 4701-856-0086;

D O I：

10.1109/23.25439

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1197 / 1202

页数：6

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