OPTIMIZING AND CONTROLLING THE RADIATION HARDNESS OF A SI-GATE CMOS PROCESS

被引：87

作者：

WINOKUR, PS

ERRETT, EB

FLEETWOOD, DM

DRESSENDORFER, PV

TURPIN, DC

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334049

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3954 / 3960

页数：7

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