FREQUENCY AND TEMPERATURE TESTS FOR LATERAL NONUNIFORMITIES IN MIS CAPACITORS

被引：28

作者：

CHANG, CC

JOHNSON, WC

机构：

[1] IND TECH RES INST, HSINCHU, TAIWAN

[2] PRINCETON UNIV, DEPT ELECT ENGN & COMP SCI, PRINCETON, NJ 08540 USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1977年 / 24卷 / 10期

关键词：

D O I：

10.1109/T-ED.1977.18988

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1249 / 1255

页数：7

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