MINORITY-CARRIER EMISSION EFFECT IN DEEP LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS ON SCHOTTKY DIODES

被引：15

作者：

LEE, WI

BORREGO, JM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 11期

关键词：

D O I：

10.1063/1.340352

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5357 / 5362

页数：6

共 19 条

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