EFFECT OF THE CAPTURE COEFFICIENT IN DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS

被引：15

作者：

LANDSBERG, PT ^{[1
]}

SHABAN, EH ^{[1
]}

机构：

[1] UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 11期

关键词：

D O I：

10.1063/1.338329

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5055 / 5061

页数：7

共 25 条

[1] THERMAL ACTIVATION-ENERGY OF GOLD-ACCEPTOR LEVEL IN SILICON [J].

ENGSTROM, O ;

GRIMMEISS, HG .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (02) :831-837

[2] THEORY OF DECAY OF EXCESS CARRIER CONCENTRATIONS IN SEMICONDUCTORS [J].

EVANS, DA ;

LANDSBERG, PT .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (02) :315-+

[3] A STEADY-STATE CONSTANT CAPACITANCE METHOD FOR THE CHARACTERIZATION OF DEEP ENERGY-LEVELS IN SEMICONDUCTORS [J].

GRIMMEISS, HG ;

KULLENDORFF, N .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (11) :5852-5854

[4] SPECTRAL DISTRIBUTION OF PHOTOIONIZATION CROSS-SECTIONS BY PHOTOCONDUCTIVITY MEASUREMENTS [J].

GRIMMEISS, HG ;

LEDEBO, LA .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (05) :2155-2162

[5] FUNDAMENTALS OF JUNCTION MEASUREMENTS IN THE STUDY OF DEEP ENERGY-LEVELS IN SEMICONDUCTORS [J].

GRIMMEISS, HG ;

OVREN, C .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (09) :1032-1042

[6]

GRIMMEISS HG, 1964, J APPL PHYS, V40, P2526

[7] GENERATION-RECOMBINATION NOISE AND DEFECT LEVELS IN SEMICONDUCTING CDSE CRYSTALS [J].

HOFFMANN, HJ ;

HUBER, E .

PHYSICA B & C, 1981, 111 (2-3) :249-256

[8] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].

LANG, DV .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032

[9] TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS [J].

LANG, DV ;

LOGAN, RA ;

JAROS, M .

PHYSICAL REVIEW B, 1979, 19 (02) :1015-1030

[10] FIELD-DEPENDENCE OF CAPTURE AND RE-EMISSION OF CHARGE-CARRIERS BY SHALLOW LEVELS IN GERMANIUM AND SILICON [J].

MARTINI, M ;

MCMATH, TA .

SOLID-STATE ELECTRONICS, 1973, 16 (02) :129-&

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