BASIC CHEMISTRY AND MECHANISMS OF PLASMA-ETCHING

被引:168
作者
FLAMM, DL
DONNELLY, VM
IBBOTSON, DE
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 01期
关键词
PLASMAS; -; Applications;
D O I
10.1116/1.582536
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A recent review of plasma etching is extended with discussions of similarity variables governing discharges, anisotropic oxide etching in fluorine and unsaturate-rich plasmas, surface texture, the loading effect, and gas-surface reactions.
引用
收藏
页码:23 / 30
页数:8
相关论文
共 48 条
[1]  
BRUCE RH, 1981, SOLID STATE TECHNOL, V24, P64
[2]  
BRUCE RH, 1981, 260 EL SOC ABSTR
[3]  
BRUCE RH, UNPUB J ELECTROCHEM
[4]   ION-ASSISTED AND ELECTRON-ASSISTED GAS-SURFACE CHEMISTRY - IMPORTANT EFFECT IN PLASMA-ETCHING [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) :3189-3196
[5]   OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) :3134-3136
[6]   DIRECTIONAL REACTIVE-ION-ETCHING OF INP WITH CL-2 CONTAINING GASES [J].
COLDREN, LA ;
RENTSCHLER, JA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (02) :225-230
[7]   SPECTROSCOPIC DIAGNOSTICS OF CF4-O2 PLASMAS DURING SI AND SIO2 ETCHING PROCESSES [J].
DAGOSTINO, R ;
CRAMAROSSA, F ;
DEBENEDICTIS, S ;
FERRARO, G .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) :1259-1265
[8]  
DAGOSTINO R, 1981, PLASMA CHEM PLASMA P, V1, P365
[9]  
DISMUKES JP, 1971, J ELECTROCHEM SOC, V18, P634
[10]   LASER DIAGNOSTICS OF PLASMA-ETCHING - MEASUREMENT OF CL2+ IN A CHLORINE DISCHARGE [J].
DONNELLY, VM ;
FLAMM, DL ;
COLLINS, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (03) :817-823