A THEORETICAL APPROACH TO THE OPTIMIZATION OF ELECTRONIC SPECKLE INTERFEROMETRY FRINGES WITH LIMITED LASER POWER

被引：11

作者：

WYKES, C ^{[1
]}

机构：

[1] COVENTRY LANCHESTER POLYTECH,DEPT PROD ENGN,COVENTRY CV1 5FB,W MIDLANDS,ENGLAND

来源：

关键词：

D O I：

10.1080/09500348714550521

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：539 / 554

页数：16

共 10 条

[1] [Anonymous], 1983, HOLOGRAPHIC SPECKLE
[2] RECORDING AND DISPLAY SYSTEM FOR HOLOGRAM INTERFEROMETRY WITH LOW RESOLUTION IMAGING DEVICES
BIEDERMANN, K
EK, L
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (07): : 571 - 576
[3] BUTTERS JN, 1971, J MEASUREMENT CONTRO, V4, P344
[4] CHAMPENEY D. C., 1973, FOURIER TRANSFORMS T
[5] Davenport WB, 1958, RANDOM SIGNALS NOISE
[6] Goodman J. W., 1963, STAT PROPERTIES LASE
[7] DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .2. DISPLACEMENT DEPENDENT DE-CORRELATION AND APPLICATIONS TO OBSERVATION OF MACHINE-INDUCED STRAIN
JONES, R
WYKES, C
[J]. OPTICA ACTA, 1977, 24 (05): : 533 - 550
[8] LOKBERG OJ, 1977, APPL OPTICS, V15, P2701
[9] GENERAL-ANALYSIS OF FRINGE CONTRAST IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
SLETTEMOEN, GA
[J]. OPTICA ACTA, 1979, 26 (03): : 313 - 327
[10] DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .1. WAVELENGTH CHANGE DEPENDENT DE-CORRELATION WITH APPLICATION TO CONTOURING AND SURFACE-ROUGHNESS MEASUREMENT
WYKES, C
[J]. OPTICA ACTA, 1977, 24 (05): : 517 - 532