PHOTOCURRENT IN THERMAL SIO2 UNDER X-RAY-IRRADIATION - SIGNIFICANCE OF CONTACT INJECTION

被引：9

作者：

CHIN, MR ^{[1
]}

MA, TP ^{[1
]}

机构：

[1] YALE UNIV,ELECT ENGN SECT,NEW HAVEN,CT 06520

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 05期

关键词：

D O I：

10.1063/1.331152

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：3673 / 3679

页数：7

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