TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS UNDER VARIOUS EXCITATION CONDITIONS

被引：14

作者：

STRELI, C

WOBRAUSCHEK, P

LADISICH, W

REIDER, R

AIGINGER, H

机构：

[1] Atominstitut der Österreichischen Universitäten, Vienna, A-1020

来源：

X-RAY SPECTROMETRY | 1995年 / 24卷 / 03期

关键词：

D O I：

10.1002/xrs.1300240310

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Total reflection x-ray fluorescence (TXRF) analysis was tested for its suitability for the photon-induced energy dispersive analysis of light elements such as B, C, N, O, F, Na and Mg using a special spectrometer meeting tbe requirements for the detection of low-energy fluorescence radiation. The influence of different spectral modification devices such as a high-energy cut-off reflector and a multilayer monochromator were compared using excitation by a Cr tube and also synchrotron radiation. The effects on intensity, background and detection limits are compared and discussed. A new method of monitoring the x-ray beam to adjust total reflection by a CCD camera is introduced. Considerations on the penetration depth and information depth of light elements are presented.

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页码：137 / 142

页数：6

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