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ELECTRICAL-PROPERTIES OF I2L N-P-N TRANSISTOR
被引:5
作者
:
EVANS, SA
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
EVANS, SA
[
1
]
HERMAN, JM
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
HERMAN, JM
[
1
]
SLOAN, BJ
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
SLOAN, BJ
[
1
]
机构
:
[1]
TEXAS INSTR INC,DALLAS,TX 75222
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1976年
/ 23卷
/ 10期
关键词
:
D O I
:
10.1109/T-ED.1976.18573
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1192 / 1194
页数:3
相关论文
共 6 条
[1]
INFLUENCE OF HEAVY DOPING ON EMITTER EFFICIENCY OF A BIPOLAR TRANSISTOR
DEMAN, HJJ
论文数:
0
引用数:
0
h-index:
0
DEMAN, HJJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(10)
: 833
-
+
[2]
Evans S. A., 1975, Electrochemical Society Spring Meeting. (Extended abstracts), P394
[3]
DEVICE PHYSICS OF INTEGRATED INJECTION LOGIC
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
机构:
EINDHOVEN UNIV TECHNOL,EINDHOVEN,NETHERLANDS
KLAASSEN, FM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(03)
: 145
-
152
[4]
AUGER RECOMBINATION IN SWAMPED MIDDLE REGION OF SILICON RECTIFIERS AND THYRISTORS
KRAUSSE, J
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FRANKFURTER RING 152,8 MUNICH 46,WEST GERMANY
SIEMENS AG,FRANKFURTER RING 152,8 MUNICH 46,WEST GERMANY
KRAUSSE, J
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(05)
: 427
-
429
[5]
TRANSPORT EQUATIONS IN HEAVILY DOPED SILICON, AND CURRENT GAIN OF A BIPOLAR TRANSISTOR
MOCK, MS
论文数:
0
引用数:
0
h-index:
0
机构:
NYU,COURANT INST MATH SCI,NEW YORK,NY 10016
MOCK, MS
[J].
SOLID-STATE ELECTRONICS,
1973,
16
(11)
: 1251
-
1259
[6]
HEAVY DOPING EFFECTS AND INJECTION EFFICIENCY OF SILICON TRANSISTORS
MOCK, MS
论文数:
0
引用数:
0
h-index:
0
机构:
NYU,COURANT INST MATH SCI,NEW YORK,NY 10029
NYU,COURANT INST MATH SCI,NEW YORK,NY 10029
MOCK, MS
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(08)
: 819
-
824
←
1
→
共 6 条
[1]
INFLUENCE OF HEAVY DOPING ON EMITTER EFFICIENCY OF A BIPOLAR TRANSISTOR
DEMAN, HJJ
论文数:
0
引用数:
0
h-index:
0
DEMAN, HJJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(10)
: 833
-
+
[2]
Evans S. A., 1975, Electrochemical Society Spring Meeting. (Extended abstracts), P394
[3]
DEVICE PHYSICS OF INTEGRATED INJECTION LOGIC
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
机构:
EINDHOVEN UNIV TECHNOL,EINDHOVEN,NETHERLANDS
KLAASSEN, FM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(03)
: 145
-
152
[4]
AUGER RECOMBINATION IN SWAMPED MIDDLE REGION OF SILICON RECTIFIERS AND THYRISTORS
KRAUSSE, J
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FRANKFURTER RING 152,8 MUNICH 46,WEST GERMANY
SIEMENS AG,FRANKFURTER RING 152,8 MUNICH 46,WEST GERMANY
KRAUSSE, J
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(05)
: 427
-
429
[5]
TRANSPORT EQUATIONS IN HEAVILY DOPED SILICON, AND CURRENT GAIN OF A BIPOLAR TRANSISTOR
MOCK, MS
论文数:
0
引用数:
0
h-index:
0
机构:
NYU,COURANT INST MATH SCI,NEW YORK,NY 10016
MOCK, MS
[J].
SOLID-STATE ELECTRONICS,
1973,
16
(11)
: 1251
-
1259
[6]
HEAVY DOPING EFFECTS AND INJECTION EFFICIENCY OF SILICON TRANSISTORS
MOCK, MS
论文数:
0
引用数:
0
h-index:
0
机构:
NYU,COURANT INST MATH SCI,NEW YORK,NY 10029
NYU,COURANT INST MATH SCI,NEW YORK,NY 10029
MOCK, MS
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(08)
: 819
-
824
←
1
→