共 12 条
- [1] PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR NUCLEAR-REACTION MICROANALYSIS OF OXYGEN ISOTOPES .1. O-16 STANDARDS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 705 - 712
- [2] BAUER RW, 1972, APPL PHYS LETT, V20, P359
- [5] INTERCOMPARISON OF ABSOLUTE STANDARDS FOR RBS STUDIES [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 147 - 148
- [6] GARULLI A, 1983, ULTRAMICROSCOPY, V12, P106
- [7] KINETICS OF TISI2 FORMATION BY THIN TI FILMS ON SI [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (09) : 5076 - 5080
- [8] SOLID-STATE REACTIONS IN TITANIUM THIN-FILMS ON SILICON [J]. THIN SOLID FILMS, 1976, 34 (01) : 135 - 138
- [9] KEMPER MJH, 1982, J APPL PHYS, V53, P6127
- [10] RIGO S, 1978, NUCL INSTRUM METHODS, V149, P713