METAL-SEMICONDUCTOR INTERFACES

被引:26
作者
WEAVER, JH
机构
[1] Univ of Minnesota, Minneapolis, MN,, USA, Univ of Minnesota, Minneapolis, MN, USA
关键词
D O I
10.1063/1.881062
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
SEMICONDUCTOR DEVICES
引用
收藏
页码:24 / 30
页数:7
相关论文
共 20 条
  • [1] THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES
    Brillson, L. J.
    [J]. SURFACE SCIENCE REPORTS, 1982, 2 (02) : 123 - 326
  • [2] INITIAL ADSORPTION STATE FOR AL ON GAAS(110) AND ITS ROLE IN THE SCHOTTKY-BARRIER FORMATION
    DANIELS, RR
    KATNANI, AD
    ZHAO, TX
    MARGARITONDO, G
    ZUNGER, A
    [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (12) : 895 - 898
  • [3] CLUSTER FORMATION AND ATOMIC INTERMIXING AT THE REACTIVE V/GE(111) INTERFACE
    DELGIUDICE, M
    JOYCE, JJ
    RUCKMAN, MW
    WEAVER, JH
    [J]. PHYSICAL REVIEW B, 1985, 32 (08): : 5149 - 5155
  • [4] DELGIUDICE M, 1986, UNPUB PHYS REV B, V33
  • [5] CLUSTER-INDUCED REACTIONS AT A METAL-SEMICONDUCTOR INTERFACE - CE ON SI(111)
    GRIONI, M
    JOYCE, J
    CHAMBERS, SA
    ONEILL, DG
    DELGIUDICE, M
    WEAVER, JH
    [J]. PHYSICAL REVIEW LETTERS, 1984, 53 (24) : 2331 - 2334
  • [6] SPECULAR BOUNDARY SCATTERING AND ELECTRICAL TRANSPORT IN SINGLE-CRYSTAL THIN-FILMS OF COSI2
    HENSEL, JC
    TUNG, RT
    POATE, JM
    UNTERWALD, FC
    [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (16) : 1840 - 1843
  • [7] TRANSISTOR ACTION IN SI/COSI2/SI HETEROSTRUCTURES
    HENSEL, JC
    LEVI, AFJ
    TUNG, RT
    GIBSON, JM
    [J]. APPLIED PHYSICS LETTERS, 1985, 47 (02) : 151 - 153
  • [8] CORRELATION OF SCHOTTKY-BARRIER HEIGHT AND MICROSTRUCTURE IN THE EPITAXIAL NI SILICIDE ON SI(111)
    LIEHR, M
    SCHMID, PE
    LEGOUES, FK
    HO, PS
    [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (19) : 2139 - 2142
  • [9] Matthews J.W, 1975, EPITAXIAL GROWTH
  • [10] NARAYANAMURTI V, 1984, PHYSICS TODAY OCT, P24