INFLUENCE OF INTERFACE SCATTERING ON THE RESISTANCE OF POLYCRYSTALLINE AU/PD MULTILAYERED THIN-FILMS

被引：21

作者：

DEVRIES, JWC

DENBROEDER, FJA

机构：

来源：

JOURNAL OF PHYSICS F-METAL PHYSICS | 1988年 / 18卷 / 12期

关键词：

D O I：

10.1088/0305-4608/18/12/014

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2635 / 2647

页数：13

共 30 条

[1] SURFACE-WAVES IN AU/CR SUPERLATTICES [J].

BISANTI, P ;

BRODSKY, MB ;

FELCHER, GP ;

GRIMSDITCH, M ;

SILL, LR .

PHYSICAL REVIEW B, 1987, 35 (15) :7813-7819

[2] PROPERTIES OF PD/AU THIN-FILM LAYERED STRUCTURES [J].

CARCIA, PF ;

SUNA, A .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (04) :2000-2005

[3] TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN NICKEL FILMS [J].

DEVRIES, JWC .

THIN SOLID FILMS, 1987, 150 (2-3) :209-215

[4] TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN GOLD-FILMS [J].

DEVRIES, JWC .

THIN SOLID FILMS, 1987, 150 (2-3) :201-208

[5] INTERFACE SCATTERING IN TRIPLE LAYERED POLYCRYSTALLINE THIN AU/X/AU FILMS (X=FE, CO, NI) [J].

DEVRIES, JWC .

SOLID STATE COMMUNICATIONS, 1988, 65 (03) :201-204

[6]

DEVRIES JWC, 1988, J PHYS F MET PHYS, V18, P331, DOI 10.1088/0305-4608/18/2/515

[7] RESISTIVITY OF THIN AU FILMS AS A FUNCTION OF GRAIN DIAMETER AND TEMPERATURE [J].

DEVRIES, JWC .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1987, 17 (09) :1945-1952

[8] SURFACE SCATTERING IN THIN EVAPORATED GOLD DOUBLE-LAYERS STUDIED BY INSITU RESISTIVITY MEASUREMENTS [J].

DEVRIES, JWC .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1987, 17 (12) :2403-2409

[9]

DEVRIES JWC, 1988, IN PRESS THIN SOLID

[10] ELECTRONIC TRANSPORT-PROPERTIES OF METALLIC MULTI-LAYER FILMS [J].

DIMMICH, R .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1985, 15 (12) :2477-2487

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